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Hexo Industries (M) Sdn Bhd
1-2-9, i-Avenue, Medan Kampung Relau 1, 11900 Bayan Lepas, Penang, Malaysia.
+6011-6528 1088
+604-611 1186
+6012-954 1088
+604-611 1186
+6012-954 1088
+6012-558 2052
+60129541088
Selangor Branch
Jalan Putra Bistari 2/5J, 47610 Subang Jaya, Selangor, Malaysia
Indonesia Branch
Jababeka Bizpark, Blok D/16, Jababeka Innovation Center, Pintu 6, Blok D/16, Cikarang, Bekasi, Jawa Barat 60292, Indonesia.
Singapore Branch
SpectrumSense Solutions
1 Scotts Road, #24-10 Shaw Centre, Singapore 228208.
TH2848 Series Frequency 4Hz-10MHz
Previous | 11 / 15 | Next |
Basic Accuracy: 0.05%
Auto Balance Bridge Technology
Spot measurement, list sweep and graphic sweep
AC Signal: 20V/100mA DC Bias: 0+/-40V, 0+/-100mA
Product description
Features
¡ö High resolution: 10.1 inches, resolution 1280*800,capacitive touch screen
¡öHigh precision: automatic balanced bridge technology, four-end pair test configuration
¡ö High stability and consistency: 15 range configurations
¡ö High power: Signal level: 20VAC /100mAAC Built-in DC bias: ±40VDC /100mADC
¡ö High speed: dual CPU architecture, the fastest test speed up to 400 times / s (2.5ms)
¡ö Convenient operation: Linux operating base, touch operation, embedded help
¡ö Three types of tests: spot test, list scan, and graphic scan
¡ö Four-parameter measurement
¡ö One-click recording, one-click screenshot
¡ö 201-point multi-parameter list scanning function
¡ö Graphic scanning function, 4 tracks at will, support 1/2/4 split screen
¡ö Piezoelectric conductivity circle test, dielectric constant test
¡ö Powerful sorting: LCR mode: 10levels of sorting Graphical analysis mode: support curve condition sorting
¡ö High compatibility: supports SCPI/MODBUS command set. Compatible with KEYSIGHT E4980A, E4980AL, HP4284A
¡ö Independent 24V cylinder control
Applications
¡ö Passive components
Evaluation of impedance parameters and performance analysis of capacitors, inductors, cores, resistors, piezoelectric devices, transformers, chip assemblies, crystals, and network components.
¡ö Semiconductor component
Parasitic parameter testing and analysis of LED driver integrated circuits; C-VDC characterization of varactor diodes; parasitic parameter analysis of transistors or integrated circuits
¡ö Other components
Impedance evaluation of printed circuit boards, relays, switches, cables, batteries, etc.
¡ö Medium Material
Evaluation of dielectric constants and loss angles of plastics, ceramics and other materials.
¡ö Magnetic material
Evaluation of permeability and loss angle of ferrites, amorphous and other magnetic materials
¡ö Semiconductor materials
Dielectric constant, electrical conductivity and C-V properties of semiconductor materials
¡ö Liquid crystal materials
C-V characteristics such as dielectric constant and elasticity constant of liquid crystal units
¡ö Piezoelectric materials and devices
Piezo Ceramic Filters, Piezo Ceramic Trap, Piezo Ceramic Discriminator, Piezo Ceramic Transformer, High Power Ultrasonic Generator, Transducer (Oscillator), Surface acoustic wave devices, electroacoustic devices, etc. can be tested such as static capacitance, loss, resonance frequency, anti-resonance frequency, mechanical coupling coefficient and other parameters.
Specifications
Accessary
Auto Balance Bridge Technology
Spot measurement, list sweep and graphic sweep
AC Signal: 20V/100mA DC Bias: 0+/-40V, 0+/-100mA
Product description
Features
¡ö High resolution: 10.1 inches, resolution 1280*800,capacitive touch screen
¡öHigh precision: automatic balanced bridge technology, four-end pair test configuration
¡ö High stability and consistency: 15 range configurations
¡ö High power: Signal level: 20VAC /100mAAC Built-in DC bias: ±40VDC /100mADC
¡ö High speed: dual CPU architecture, the fastest test speed up to 400 times / s (2.5ms)
¡ö Convenient operation: Linux operating base, touch operation, embedded help
¡ö Three types of tests: spot test, list scan, and graphic scan
¡ö Four-parameter measurement
¡ö One-click recording, one-click screenshot
¡ö 201-point multi-parameter list scanning function
¡ö Graphic scanning function, 4 tracks at will, support 1/2/4 split screen
¡ö Piezoelectric conductivity circle test, dielectric constant test
¡ö Powerful sorting: LCR mode: 10levels of sorting Graphical analysis mode: support curve condition sorting
¡ö High compatibility: supports SCPI/MODBUS command set. Compatible with KEYSIGHT E4980A, E4980AL, HP4284A
¡ö Independent 24V cylinder control
Applications
¡ö Passive components
Evaluation of impedance parameters and performance analysis of capacitors, inductors, cores, resistors, piezoelectric devices, transformers, chip assemblies, crystals, and network components.
¡ö Semiconductor component
Parasitic parameter testing and analysis of LED driver integrated circuits; C-VDC characterization of varactor diodes; parasitic parameter analysis of transistors or integrated circuits
¡ö Other components
Impedance evaluation of printed circuit boards, relays, switches, cables, batteries, etc.
¡ö Medium Material
Evaluation of dielectric constants and loss angles of plastics, ceramics and other materials.
¡ö Magnetic material
Evaluation of permeability and loss angle of ferrites, amorphous and other magnetic materials
¡ö Semiconductor materials
Dielectric constant, electrical conductivity and C-V properties of semiconductor materials
¡ö Liquid crystal materials
C-V characteristics such as dielectric constant and elasticity constant of liquid crystal units
¡ö Piezoelectric materials and devices
Piezo Ceramic Filters, Piezo Ceramic Trap, Piezo Ceramic Discriminator, Piezo Ceramic Transformer, High Power Ultrasonic Generator, Transducer (Oscillator), Surface acoustic wave devices, electroacoustic devices, etc. can be tested such as static capacitance, loss, resonance frequency, anti-resonance frequency, mechanical coupling coefficient and other parameters.
Specifications
Product Model | TH2848-02L | TH2848-02 | TH2848-05 | TH2848-10 | |
Display | Monitor | 10.1-inch (diagonal) capacitive touch screen | |||
Scale | 16:9 | ||||
Resolution | 1280×RGB×800 | ||||
Measured Parameters | Methods | Four parameters can be selected arbitrarily | |||
AC | Cp,Cs,Lp,Ls,Rp,Rs,|Z|,|Y|,R,X,G,B,θ,D,Q,VAC,IAC, | ||||
DC | RDC | ||||
Piezoelectricity | Ct,Dt,Fs,Fp,Fp-Fs,Zmin,Zmax,F1,F2,F2-F1,Gmax,C0,C1,R1,L,Kp,Keff,Kt,K31,K33,Qm,ε,εr | ||||
Dielectric | Cp,D,ε,|ε|,εr',εr'',tanδ,Q | ||||
Test Frequency | Range | 4Hz-2MHz | 4Hz-2MHz | 4Hz-5MHz | 4Hz-10MHz |
Accuracy | 0.01% | ||||
Resolution | 0.1mHz 4.0000Hz-99.9999Hz | ||||
1mHz 100.000Hz-999.999Hz | |||||
10mHz 1.00000kHz-9.99999kHz | |||||
100mHz 10.0000kHz-99.9999kHz | |||||
1Hz 100.000kHz-999.999kHz | |||||
10Hz 1.00000MHz-9.99999MHz | |||||
AC Test Signal Mode | Rating Value (ALC OFF) |
The set voltage is the Hcur voltage when the test terminal is open-circuit. The set current is the current from Hcur when the test terminal is short-circuited. |
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Constant Value(ALC ON) |
Keep the voltage on the DUT the same as the set value Keep the current on the DUT the same as the set value |
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Test level | Voltage range | 0Vrms - 2Vrms | 0mVrms-20Vrms F<=1MHz | ||
0mVrms-15Vrms 1MHz |
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0mVrms-2Vrms 2MHz |
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0mVrms-1Vrms 5MHz |
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Accuracy | ±(10%×set value+2mV)(AC<=Vrms) | ||||
±(10%×set value+5mV)(AC£¾2Vrms) | |||||
Resolution | 0.1mVrms 0mVrms-0.2Vrms | ||||
0.2mVrms 0.2Vrms-0.5Vrms | |||||
0.5mVrms 0.5Vrms-1Vrms | |||||
1mVrms 1Vrms-10Vrms | |||||
10mVrms 10Vrms-20Vrms | |||||
Current range | 0mArms-20mArms | 0mArms-100mArms | |||
Resolution (100Ω internal resistance) | 1μArms 0Arms-2mArms | ||||
2μArms 2mArms-5mArms | |||||
5μArms 5mArms-10mArms | |||||
10μArms 10mArms-100mArms | |||||
RDC test | Voltage range | 100mV-1V | |||
Resolution | 100μV | ||||
Current range | 0mA-10mA | ||||
Resolution | 10μA | ||||
DC Bias | voltage range | 0V-±10V | 0V-±40V | ||
Accuracy | 1%×set voltage+5mV AC<=2V | ||||
2%×set voltage+8mV AC>2V | |||||
Resolution | 0.1mV 0V - ±5V | ||||
1mV ±5V - ±40V | |||||
Current range | 0mA - ±100mA | ||||
Resolution | 1μA 0mA-50mA | ||||
10μA 50mA-100mA | |||||
Voltage source | voltage range | -10V - 10V | |||
Resolution | 1mV | ||||
Current range | -45mA - +45mA | ||||
Output Impedance | 100Ω | ||||
Cylinder control | Switching control | ||||
Turn on | Turns on within the set time from 0-60s | ||||
Turn off | Turns off within the set time from 0-60s | ||||
Test Side Configuration | Four-terminal pair | ||||
Test cable length | 0m,1m | ||||
Output Impedance | 100Ω£¬±1%@1kHz | ||||
Mathematical operation | Absolute deviation Δ from nominal value, percentage deviation Δ% from nominal value | ||||
Equivalence mode | Series, parallel | ||||
Calibration function | OPEN,SHORT,LOAD | ||||
Measured average | 1-255 times | ||||
Range Selection | AUTO,HOLD | ||||
Trigger Mode | Continuous, single | ||||
Trigger delay | 0-60s | ||||
specific function | One-click screenshot, one-click record, embedded help system | ||||
Range Configurat | LCR | 100mΩ,1Ω,10Ω,20Ω,50Ω,100Ω,200Ω,500Ω,1kΩ,2kΩ,5kΩ,10kΩ,20kΩ,50kΩ,100kΩ | |||
RDC | 10Ω,20Ω,50Ω,100Ω,200Ω,500Ω,1kΩ,2kΩ,5kΩ,10kΩ,20kΩ,50kΩ,100kΩ | ||||
Measuring time (ms/time) (Frequency >= 100kHz) | Fast: 2.5ms Medium: 90ms Slow: 220ms | ||||
Maximum accuracy | 0.05%(refer to specifications) | ||||
Measurement display range | |||||
Cs,Cp | 0.00001pF - 9.99999F | ||||
Ls,Lp | 0.00001μH - 99.9999kH | ||||
D | 0.00001 - 9.99999 | ||||
Q | 0.00001 - 99999.9 | ||||
R,Rs,Rp,X,Z,RDC | 0.001mΩ - 99.9999MΩ | ||||
G,B,Y | 0.00001μs - 99.9999S | ||||
VDC | ±0V - ±999.9999V | ||||
IDC | ±0A - ±999.9999A | ||||
θr | -6.28318 | ||||
θd | -179.999° - 179.999° | ||||
Δ% | ±(0.000% - 999.9%) | ||||
Multifunction parameter list scanning | Points | 201 points, average can be set for each point, each point can be sorted individually | |||
Parameters | Test frequency, AC voltage, AC current, DC BIAS voltage, DC BIAS current, with dielectric constant test function based on the parameter of each point in this list | ||||
Trigger Mode |
Sequential SEQ: When triggered once, measurements are taken at all scan points, /EOM/INDEX is output only once Step STEP: performs one scan point measurement per trigger, outputs /EOM/INDEX for each point, but list scan comparator result is only output at the last /EOM |
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Other features |
1.Multiple copy functions for both scanning and test parameters 2.Time delay can be set for each scanning point |
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Dielectric constant | Dielectric Material Testing Solutions | ||||
Comparator | Each scanning point can measure up to four test parameters, each parameter can be set upper and lower limits, all test parameters are qualified to output PASS signal, otherwise output FAIL signal, no judgment if no upper and lower limits are set. | ||||
Graphic Scanning | Scanning Points | Points 51, 101, 201, 401, 801 are optional | |||
Results Display | Extreme values for each parameter and the scanned parameter value at the point where the cursor is located with the corresponding test parameter value | ||||
Piezoelectric testing | Piezoelectric device and piezoelectric material testing solutions, integrated piezoelectric admittance circle function | ||||
Scanning track | 1-4 test parameters can be selected arbitrarily, and the scanning curve can be divided into one screen, two screens and four screens. | ||||
Display range | Real-time automatic, locked | ||||
Coordinate scale | Logarithmic, linear | ||||
Scanning parameters | Frequency, AC Voltage, AC Current, DCV BIAS/DCI BIAS | ||||
Trigger method, Single | Trigger manually once, one scan from start to finish is completed, the next trigger signal starts a new scan | ||||
Trigger method, Sequential | Infinite loop scanning from start to finish | ||||
Results Saving | Graphics, documentation | ||||
Comparator | Bin Staging | 10Bin,PASS,FAIL | |||
Bin deviation setting | Deviation value, percent deviation value, off | ||||
Bin mode | Tolerance, continuous | ||||
Bin Count | 0-99999 | ||||
BIN Judgement | Up to four parameters can be set for the limit range. If the results of the four test parameters fall within the set range, the corresponding BIN number is displayed. If it exceeds the maximum BIN number range set, it displays FAIL. Test parameters without upper and lower limits set will be automatically ignored for BIN judgement. | ||||
PASS/FAIL Indication | If it meets Bin1-10 criteria, the PASS light on the front panel lights up; otherwise, the FAIL light is illuminated. | ||||
Data Cache | 201 measurement results can be batch-read. | ||||
Storage | Internal | The instrument has 8GB of built-in storage space, after removing the system occupancy, the user can use about 6GB of space. | |||
External USB | Test setup files, screenshot graphics, record files | ||||
Keyboard Lock | Lockable front panel keys | ||||
Interfaces | USB HOST | 2 USB HOST ports, can be connected to the mouse, keyboard, U disk can only be used one at a time | |||
USB DEVICE | Universal Serial Bus socket, small Class B (4 contact positions); compliant with USB TMC-USB 488 and USB2.0, female connector is used to connect an external controller. | ||||
LAN | 10/100M Ethernet, 8-pin, two speeds adaptive | ||||
HANDLER | For Bin Staging Signal Output | ||||
GPIB | Standard | ||||
RS232C | Standard 9-pin, Crossed | ||||
RS485 | Standard | ||||
Power-on warm-up time | 60 minutes. | ||||
Input Voltage | 100-120VAC/198-242VAC selectable£¬47-63Hz | ||||
Power supply power | Not less than 130VA | ||||
Dimensions(WxHxD)mm | 430x177x265 | ||||
Weights | 11kg |
Accessary
Standard | ||||||
Accessories name | Model | |||||
Four-end clamp with card | TH26005D |
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Short circuit | TH26010 |
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Kelvin test lead with box four-terminal insulation and lock | TH26011BS |
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Optional | ||||||
Accessories name | Model | |||||
Box patch test cable | TH26009B |
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Magnetic ring fixture | TH26008A |
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Dielectric test fixture | TH26077 |
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