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Hexo Industries (M) Sdn Bhd
1-2-9, i-Avenue, Medan Kampung Relau 1, 11900 Bayan Lepas, Penang, Malaysia.
+6011-6528 1088
+604-611 1186
+6012-954 1088
+604-611 1186
+6012-954 1088
+6012-558 2052
+60129541088
Selangor Branch
Jalan Putra Bistari 2/5J, 47610 Subang Jaya, Selangor, Malaysia
Indonesia Branch
Jababeka Bizpark, Blok D/16, Jababeka Innovation Center, Pintu 6, Blok D/16, Cikarang, Bekasi, Jawa Barat 60292, Indonesia.
Singapore Branch
SpectrumSense Solutions
1 Scotts Road, #24-10 Shaw Centre, Singapore 228208.
TH2840X Series Automatic Transformer Test system
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Basic Accuracy: 0.05%.
Frequency: 20Hz-2MHz
Electric Level: 5mV-20V/50uA-100mA
DC Bias Current Source 0+/-40V, 0+/-100mA
Linux OS
LCR Function Optional
Features
¡ö The test speed is as high as 1800 times/s (>10kHz), without relay action time
¡ö Test level up to 20Vrms
¡ö The bias voltage is built-in ±40V/±100mA/2A
¡ö Up to 288 test pins (only TH2840NX)
¡ö Industry-friendly user experience: Linux bottom layer, built-in help file
¡ö 10.1 inch 1280×800 capacitive touch screen
¡ö Graphical pin association setting page, so that wiring is no longer a problem
¡ö Lk setting does not need to input the leakage inductance pin, which is more intuitive
¡ö Enhanced balance scanning function, from 5 points to 10 points
¡ö Range switching adopts electronic switch, fast speed, long life, no noise
¡ö Optional LCR function
¡ö Approximately 100M setting file storage space in the machine, and massive U disk setting file storage capacity
¡ö Provide host computer to support early model file format conversion to ensure compatibility
Applications
¡ö Switching transformer scanning test, comprehensive characteristics analysis.
¡ö Network transformer scanning test, comprehensive characteristics analysis
¡ö Discrete passive components (L, R, C) multi-channel scanning test
¡ö Relay drive line package, contact resistance multi-channel scanning test
¡ö Multi-channel DC resistance DCR scanning test
¡ö Comprehensive test analysis of multiple passive components in impedance network
Specifications
Accessary
Frequency: 20Hz-2MHz
Electric Level: 5mV-20V/50uA-100mA
DC Bias Current Source 0+/-40V, 0+/-100mA
Linux OS
LCR Function Optional
Features
¡ö The test speed is as high as 1800 times/s (>10kHz), without relay action time
¡ö Test level up to 20Vrms
¡ö The bias voltage is built-in ±40V/±100mA/2A
¡ö Up to 288 test pins (only TH2840NX)
¡ö Industry-friendly user experience: Linux bottom layer, built-in help file
¡ö 10.1 inch 1280×800 capacitive touch screen
¡ö Graphical pin association setting page, so that wiring is no longer a problem
¡ö Lk setting does not need to input the leakage inductance pin, which is more intuitive
¡ö Enhanced balance scanning function, from 5 points to 10 points
¡ö Range switching adopts electronic switch, fast speed, long life, no noise
¡ö Optional LCR function
¡ö Approximately 100M setting file storage space in the machine, and massive U disk setting file storage capacity
¡ö Provide host computer to support early model file format conversion to ensure compatibility
Applications
¡ö Switching transformer scanning test, comprehensive characteristics analysis.
¡ö Network transformer scanning test, comprehensive characteristics analysis
¡ö Discrete passive components (L, R, C) multi-channel scanning test
¡ö Relay drive line package, contact resistance multi-channel scanning test
¡ö Multi-channel DC resistance DCR scanning test
¡ö Comprehensive test analysis of multiple passive components in impedance network
Specifications
Model | TH2840AX | TH2840BX | TH2840NX | |
Display | Display | 10.1'' Captive Touch Screen | ||
Ratio | 16:09 | |||
Resolution | 1280×RGB×800 | |||
Test PIN | 20PIN(By TH1806) | 48PIN(Can extend to 288PIN) | ||
Frequency | Range | 20Hz-500kHz | 20Hz-2MHz | 20Hz-500kHz |
Accuracy | 0.01% | |||
Resolution | 0.1mHz (20.0000Hz-99.9999Hz) | |||
1mHz (100.000Hz-999.999Hz) | ||||
10mHz (1.00000kHz-9.99999kHz) | ||||
100mHz (10.0000kHz-99.9999kHz) | ||||
1Hz (100.000kHz-999.999kHz ) | ||||
10Hz (1.00000MHz-2.00000MHz) | ||||
AC test signal mode | Rated value (ALC OFF) | Set the voltage as the Hcur voltage when the test terminal is open | ||
Set the current to be the current flowing from Hcur when the test terminal is short-circuited | ||||
Constant value (ALC ON) | Keep the voltage on the DUT the same as the set value | |||
Keep the current on the DUT the same as the set value | ||||
Test Level | AC Voltage | 5mVrms-20Vrms | F<=1MHz 5mVrms-20Vrms | 5mVrms-20Vrms |
F>1MHz 5mVrms-15Vrms | ||||
Accuracy | ±(10%×the set value+2mV)(AC<=2Vrms) | |||
±(10%×the set value+5mV)(AC£¾2Vrms) | ||||
Resolution | 1mVrms (5mVrms-0.2Vrms) | |||
1mVrms (0.2Vrms-0.5Vrms) | ||||
1mVrms (0.5Vrms-1Vrms) | ||||
10mVrms (1Vrms-2Vrms) | ||||
10mVrms (2Vrms-5Vrms) | ||||
10mVrms (5Vrms-10Vrms) | ||||
10mVrms (10Vrms-20Vrms) | ||||
AC Current | 50μArms-100mArms | |||
Resolution(100Ω Internal Resistance) |
10μArms (50μArms-2mArms) | |||
10μArms (2mArms-5mArms) | ||||
10μArms (5mArms-10mArms) | ||||
100μArms (10mArms-20mArms) | ||||
100μArms (20mArms-50mArms) | ||||
100μArms (50mArms-100mArms) | ||||
RDC Test | Voltage | 100mV-20V | ||
Resolution | 1mV (0V-1V) | |||
10mV (1V-20V) | ||||
Current | 0mA-100mA | |||
Resolution | 10μA (0mA-10mA) | |||
100μA (10mA-100mA) | ||||
DC Bias * | Voltage | 0V-±40V | ||
Accuracy | AC<=2V 1%×the set voltage+5mV | |||
AC>2V 2%×the set voltage+8mV | ||||
Resolution | 1mV (0V - ±1V) | |||
10mV (±1V - ±40V) | ||||
Current | 0mA-±100mA | |||
Resolution | 10μA (0mA-10mA) | |||
100μA (10mA-100mA) | ||||
Built-in current source | Current | 0mA-2A | ||
Accuracy | I>5mA ±(2%×the set value+2mA) | |||
Resolution | 1mA | |||
Output impedance | 30Ω, ±4%@1kHz | |||
100Ω, ±2%@1kHz | ||||
LCR Function | ||||
Test Parameter | Method | Arbitrary selection of four parameters | ||
AC | Cp/Cs, Lp/Ls, Rp/Rs, |Z|, |Y|, R, X, G, B, θ, D, Q, VAC, IAC | |||
DC | RDC, VDC, IDC | |||
Test Terminal Configuration | Four Terminal Pair | |||
Test Cable Length | 0m | |||
Computation | The absolute deviation from the nominal value Δ, the percentage deviation from the nominal value Δ% | |||
Equivalent Way | Series, Parallel | |||
Calibration Function | OPEN, SHORT, LOAD | |||
Average Times | 1-255 | |||
Range Selection | AUTO, HOLD | |||
Range Configuration | LCR | 100mΩ, 1Ω, 10Ω, 20Ω, 50Ω, 100Ω, 200Ω, 500Ω, 1kΩ, 2kΩ, 5kΩ, 10kΩ, 20kΩ, 50kΩ, 100kΩ | ||
RDC | 1Ω, 10Ω, 20Ω, 50Ω, 100Ω, 200Ω, 500Ω, 1kΩ, 2kΩ, 5kΩ, 10kΩ, 20kΩ, 50kΩ, 100kΩ | |||
Test Speed (ms) | Fast+: 1ms. Fast: 3.3ms. Middle: 90ms. | |||
Slow: 220ms | ||||
Highest accuracy | 0.05% Please refer to the manuals for the details | |||
Measurement display range | ||||
Cs, Cp | 0.00001pF-9.99999F | |||
Ls, Lp | 0.00001μH-99.9999kH | |||
D | 0.00001-9.99999 | |||
Q | 0.00001-99999.9 | |||
R, Rs, Rp, X, Z, RDC | 0.001mΩ-99.9999MΩ | |||
G, B, Y | 0.00001μs-99.9999S | |||
VDC | ±0V-±999.999V | |||
IDC | ±0A-±999.999A | |||
θr | -6.28318 | |||
θd | -179.999°-179.999° | |||
Δ% | ±(0.000%-999.9%) | |||
TurnsRatio | 1£º0.001—1000£º1 | |||
Transformer Test | ||||
Test Parameter |
Cs/Cp, Ls/Lp, DCR, Zx, Rs/Rp, D, Q, dZ, , Lk, Phase, Balance Turns-Ratio, Ns:Np=U2/U1, Np:Ns=U1/U2 Turns: Ns=Np×U2/U1, Np=Ns×U1/U2 |
|||
Test Mode | Continous | In the single trigger mode, manually trigger once, and once test all the test parameters. | ||
Step | In the single trigger mode, manually trigger once to measure one parameter. Trigger again to measure the next parameter. | |||
Test Speed (ms) | Fast | Fast: 3.3ms, Fast+ 0.56ms(>10kHz) | ||
Middle | Middle: 90ms | |||
Slow | Slow: 220ms | |||
Bias Resource | See * | |||
Average Times | Each test parameter can set different average times, the average times is 0-255 | |||
Time Delay | Each test parameter can set a different delay time | |||
Transformer Scanning | ||||
Built in Scanning Board | No | One Board as standard. Could extend to six boards. ((24×2)PIN per board) | ||
Transformer Handler | PIN Definition | NS1-NS30, GOOD, NG, TEST, TRIGGER, RESET | NS1-NS9, GOOD, NG, TEST, TRIGGER, RESET | |
Output characteristics | Optocoupler isolation, ULN2003 drive enhancement, collector output | |||
Model | Direct reading, percentage | |||
Test Range | Auto, Hold | |||
Bias Resource | See * | |||
External scanning box | compatible to TH1901 series, TH1831 scanning box, TH1806 series | |||
Number of windings | Primary | 60 | ||
Secondary | 9 | |||
Average Times | Each test parameter can set different average times, the average times is 0-255 | |||
Time Delay | Each test parameter can set a different delay time | |||
Test Speed (ms) | Fast | Fast: 3.3ms(>=1kHz). Fast+ : 0.56ms(>=10kHz) (Exclude the time for the realy action) | ||
Middle | Middle: 90ms | |||
Slow | Slow: 220ms | |||
Test lead interface | 25*2pin FRC socket | |||
Other Functions and specifications | ||||
Storage | Internal | About 100M non-volatile memory test setting file | ||
U Disk | Test setting file, screenshot graph, record file | |||
Keyboard Lock | The front panel keys can be locked | |||
Interface | USB HOST | 2 USB HOST ports. Mouse and keyboard could work at the same time. Only one U disk can be used at the same time. | ||
USB DEVICE | Universal serial bus socket, small type B (4 contact positions); compatible with USB TMC-USB488 and USB2.0, the female connector is used to connect an external controller. | |||
LAN | 10/100M Ethernet adaptive, 8 Pin | |||
HANDLER | Used for Bin signal output | |||
External DC BIAS Control | Support TH1778A (do not support transformer scanning) | |||
RS232C | Standard 9-pin, cross | |||
RS485 | Can accept modification or connect to RS232 to RS485 adaptor | |||
Power-on Warm-up Time | 60 Minutes | |||
Output Voltage | 100-120VAC/198-242VAC Optional, 47-63Hz | |||
Power Consumption | More than 130VA | |||
Size (WxHxD) mm | 430mm(W)x177mm(H)x265mm(D) | 430mm(W)x177mm(H)x405mm(D) | ||
Weight (kg) | 11kg | 17kg |
Accessary
Standard | ||||||
Accessories name | Model | |||||
Kelvin test lead with box four-terminal insulation and lock | TH26011BS |
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Connection Cable | TH26058A |
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Test line at both ends | TH26004B |
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Manual transformer scan test fixture | TH1806B |
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Foot switch | TH1801-001 |
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